The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2025
Filed:
Jun. 13, 2023
Infinisense Technologies Gmbh, Munich, DE;
Patrick Wissmann, Munich, DE;
Nicolas Emanuel Ulrich, Munich, DE;
Infinisense Technologies GmbH, Munich, DE;
Abstract
A method and intraoral scanner are provided for detecting topography of the surface by at least partly superimposing a first and a second sub-topography. Each sub-topography is detected by projecting a total measurement pattern onto a respective sub-region of the surface by a projection device. The total measurement pattern has at least two different measurement patterns, each of which has parallel measurement lines, and each of the measurement patterns is assigned to a diffractive optical element, by means of which measurement lines can be generated by light diffraction. The method then provides a first and a second image of each sub-region, a first measurement pattern being projected onto the sub-region of the surface in the first image and a second measurement pattern being projected onto the sub-region of the surface in the second image, and detects the sub-topographies by triangulation in each case.