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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12433552 B1

PDFFull Text
Date of Patent:
Oct. 07, 2025

Filed:

Oct. 21, 2022

Estimating scatter in x-ray images caused by imaging system components using kernels based on beam hardening

Applicant:

Siemens Healthineers International Ag, Palo Alto, CA (US);

Inventors:

Mathieu Plamondon, Glattbrugg, CH;

Balazs Nagy, Schlieren, CH;

Mathias Lehmann, Zürich, CH;

Adam Michal Strzelecki, Daettwil, CH;

Igor Peterlik, Kuenten, CH;

Dieter Marc Seghers, Zürich, CH;

Assignee:

SIEMENS HEALTHINEERS INTERNATIONAL AG, , CH;

Attorney:

SU IP CONSULTING

Primary Examiner:

David J Makiya

Assistant Examiner:

Soorena Kefayati

Int. Cl.
CPC ...
A61B 6/40 (2024.01); A61B 6/00 (2024.01); A61B 6/03 (2006.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/4085 (2013.01); A61B 6/032 (2013.01); A61B 6/5282 (2013.01); G06T 11/005 (2013.01); G06T 2207/10081 (2013.01); G06T 2211/452 (2023.08);
Abstract

A computer-implemented method of reducing scatter in an X-ray projection image of an object, the method comprising: generating an initial X-ray projection image of an object with an imaging beam produced by an imaging system; based on a first transmission indicator for the object and on a second transmission indicator for at least one element of the imaging system, selecting a kernel for convolution of the initial projection image; convolving the initial X-ray projection image with the kernel to generate a scatter component of the initial X-ray projection image; and generating a corrected X-ray projection image by removing the scatter component from the initial X-ray projection image.

Find Patent Forward Citations

Plamondon, Mathieu. (2025). Estimating scatter in x-ray images caused by imaging system components using kernels based on beam hardening (U.S. Patent No. 12433552). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12433552

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