The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2025

Filed:

Jun. 10, 2021
Applicant:

Welch Allyn, Inc., Skaneateles Falls, NY (US);

Inventors:

Yaolong Lou, Singapore, SG;

Yuan Ing Chow, Singapore, SG;

Shadakshari Devarajaiah Chikkanaravangala, Singapore, SG;

Assignee:

Welch Allyn, Inc., Skaneateles Falls, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/103 (2006.01); A61B 3/00 (2006.01); A61B 3/14 (2006.01); G16H 30/40 (2018.01);
U.S. Cl.
CPC ...
A61B 3/103 (2013.01); A61B 3/0025 (2013.01); A61B 3/14 (2013.01); G16H 30/40 (2018.01);
Abstract

A system includes system housing, an eccentric radiation source, and a radiation sensor. The radiation produced by the eccentric radiation source can be collected by the radiation sensor to generate images of retinas for a patient. The system also includes a vision screening device connected with the eccentric radiation source and the radiation sensor via the system house that can control and synchronize actions for the eccentric radiation source and the radiation sensor. The vision screening device further analyzes the images generated by the radiation sensor via neural network algorithms to determine spherical error slopes, refractive errors, and recommendations for the patient.


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