The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2025
Filed:
Jul. 07, 2021
Qualcomm Incorporated, San Diego, CA (US);
Srinivas Yerramalli, San Diego, CA (US);
Mukesh Kumar, Hyderabad, IN;
Alexandros Manolakos, Escondido, CA (US);
Sven Fischer, Nuremberg, DE;
Marwen Zorgui, San Diego, CA (US);
Lorenzo Ferrari, Castro Valley, CA (US);
Yih-Hao Lin, San Diego, CA (US);
Xiaoxia Zhang, San Diego, CA (US);
Rajat Prakash, San Diego, CA (US);
Guttorm Ringstad Opshaug, Redwood City, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
A signal measuring method includes: receiving, at a user equipment, first positioning assistance data having a first area of applicability and a first positioning assistance data profile; storing the first positioning assistance data at the user equipment; determining, at the user equipment, that second positioning assistance data correspond to the first positioning assistance data based on the first area of applicability including a second area of applicability, of the second positioning assistance data, and based on a second positioning assistance data profile of the second positioning assistance data corresponding to the first positioning assistance data profile; and measuring, at the user equipment, a positioning signal corresponding to the second area of applicability using the first positioning assistance data in response to determining that the second positioning assistance data correspond to the first positioning assistance data.