The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2025

Filed:

Nov. 21, 2023
Applicant:

Adeia Imaging Llc, San Jose, CA (US);

Inventors:

Anup Basu, Saint Albert, CA;

Ning Xu, Irvine, CA (US);

Assignee:

Adeia Imaging LLC, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 23/959 (2023.01); H04N 23/54 (2023.01); H04N 23/67 (2023.01); H04N 25/47 (2023.01);
U.S. Cl.
CPC ...
H04N 23/959 (2023.01); H04N 23/54 (2023.01); H04N 23/67 (2023.01); H04N 25/47 (2023.01);
Abstract

Systems and methods are provided for a camera and use of a camera to capture image data from 3D scenes and thereby generate large depth of field visualizations. The camera includes an optical system configured to generate an image of the 3D scene, an image sensor array positioned to receive the image of the 3D scene and including a plurality of image sensor segments, and a plurality of extensible members, each extensible member coupled between one of the image sensor segments and a housing and configured to move each coupled image sensor segment parallel to an optical axis of the optical system. In the process, the image data generated by the camera is captured and analyzed by control circuitry, and further movements of the image sensor segments are based on the analyzed image data.


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