The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2025

Filed:

Dec. 19, 2022
Applicant:

Adeia Guides Inc., San Jose, CA (US);

Inventors:

Tao Chen, Palo Alto, CA (US);

Reda Harb, Issaquah, WA (US);

Assignee:

Adeia Guides Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 21/24 (2011.01); H04N 21/414 (2011.01);
U.S. Cl.
CPC ...
H04N 21/2407 (2013.01); H04N 21/41407 (2013.01);
Abstract

There is provided systems and methods for estimating quality of experience, QoE, for a media stream. The systems and methods comprise receiving a first window of frames of the media stream, receiving a second window of frames of the media stream, measuring a plurality of metrics relating to the first and the second windows of frames, aggregating the plurality of metrics for each window of frames, and determining a window quality of experience value based on the aggregated plurality of metrics.


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