The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2025
Filed:
May. 20, 2024
Fairchild Imaging, Inc., San Jose, CA (US);
Alexander Lu, San Jose, CA (US);
William G. Tian, Campbell, CA (US);
Angel Lopez, Newark, CA (US);
Mark Hess, San Francisco, CA (US);
FAIRCHILD IMAGING, INC., San Jose, CA (US);
Abstract
Defect detection and correction circuitry for image sensors. Example circuitry includes dynamic defect detection circuitry configured to determine an average of a subset of a plurality of pixel output values, the subset excluding maximum and minimum values from among the plurality of pixel output values, determine one or more thresholds based on the average and a difference between a second highest pixel output value and a second lowest pixel output value from among the plurality of pixel output values, and based on an original output value of a pixel-under-correction (PUC) transgressing one of the thresholds, indicate that the PUC has a dynamic defect. The circuitry further includes defect correction circuitry configured to apply a defect correction process based the PUC having either a dynamic defect or a mapped defect, and to produce a corrected output value for the PUC based on the defect correction process.