The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2025
Filed:
Nov. 25, 2020
Lg Energy Solution, Ltd., Seoul, KR;
Dong Hun Song, Daejeon, KR;
Tai Joon Seo, Daejeon, KR;
Woo Yong Lee, Daejeon, KR;
Chun Ho Kwon, Daejeon, KR;
Tai Jin Jung, Daejeon, KR;
LG Energy Solution, Ltd., Seoul, KR;
Abstract
The present invention relates to a method for manufacturing an electrode assembly. The method for manufacturing the electrode assembly comprises: a step (a) of transferring a plurality of radical units one by one from a first set position to a second position; a step (b) of measuring a distance between a full width end that is an end of the first electrode in a full width direction and a full width end that is an end of the second electrode in a full width direction; a step (c) of measuring a distance (B) from a reference point (O) of the second set position to the full width end of the first electrode of the first radical unit; a step (d) of stacking the second radical unit on the first radical unit; a step (e) of measuring a distance (B) from the reference point (O) of the second set position to the full width end of the first electrode of the second radical unit; a step (f) of measuring a distance (C) between the full length end of the first electrode of the first radical unit and the full width end of the second electrode of the second radical unit by adding the distances (B, A) to each other and subtracting the distance (B) from the sum of the distances (B, A); and a step (g) of comparing the distances (C, A) to each other to determine whether stacking is defective.