The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2025

Filed:

Jun. 13, 2023
Applicant:

Korea Institute of Science and Technology, Seoul, KR;

Inventors:

Donghun Kim, Seoul, KR;

Sang Soo Han, Seoul, KR;

Leslie Tiong Ching Ow, Seoul, KR;

Hyukjun Yoo, Seoul, KR;

Nayeon Kim, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/98 (2022.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06V 10/98 (2022.01); G06V 10/82 (2022.01);
Abstract

There is provided a method and an apparatus for diagnosing an object placement error by using an artificial neural network by which feature data of the (N+1)-th stage among the feature data of a plurality of stages is generated by using any one feature data among a plurality of feature data generated in an operation process of a main network and feature data of the plurality of stages, and a placement error of at least one object is diagnosed by using an artificial neural network of a new structure, and thus, the diagnosis accuracy of a placement error of an object that is difficult to detect an edge, such as a transparent vial, may be greatly increased.


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