The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2025

Filed:

Jan. 11, 2023
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

In Huh, Seoul, KR;

Younggu Kim, Hwaseong-si, KR;

Changwook Jeong, Hwaseong-si, KR;

Jaemyung Choe, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/55 (2019.01); G06F 16/56 (2019.01); G06V 10/762 (2022.01); G06V 10/77 (2022.01); G06V 10/774 (2022.01);
U.S. Cl.
CPC ...
G06V 10/762 (2022.01); G06F 16/55 (2019.01); G06F 16/56 (2019.01); G06V 10/7715 (2022.01); G06V 10/774 (2022.01);
Abstract

A method of clustering patterns of an integrated circuit includes; providing a pattern image and numeric data, as input data corresponding to a first pattern to a first model, wherein the first model is trained by a plurality of sample images and a plurality of sample values, obtaining a content latent variable using the first model, and grouping a plurality of content latent variables corresponding to a plurality of patterns into a plurality of clusters based on a Euclidean distance, wherein the numeric data represents at least one attribute of the first pattern.


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