The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2025
Filed:
Mar. 18, 2022
Applicant:
Naver Labs Corporation, Seongnam-si, KR;
Inventor:
Nam-Il Kim, Seongnam-si, KR;
Assignee:
NAVER LABS CORPORATION, Seongnam-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/56 (2022.01); G06T 7/70 (2017.01); G06T 7/90 (2017.01); G06V 10/60 (2022.01); G06V 10/764 (2022.01); G06V 10/766 (2022.01); G06V 10/82 (2022.01); G06V 20/56 (2022.01);
U.S. Cl.
CPC ...
G06V 10/56 (2022.01); G06T 7/70 (2017.01); G06T 7/90 (2017.01); G06V 10/60 (2022.01); G06V 10/764 (2022.01); G06V 10/766 (2022.01); G06V 10/82 (2022.01); G06V 20/56 (2022.01); G06T 2207/10024 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30252 (2013.01);
Abstract
An electronic device and an operational method thereof according to various embodiments relate to detection of reflectivity information of deep learning-based virtual environment point cloud data, and that is configured such that: image data and point cloud data are acquired; physical information including location information and color information for each point of point cloud data are detected on the basis of the image data; and deep learning for the point cloud data is performed on the basis of the physical information to detect reflectivity information of the point cloud data.