The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2025

Filed:

Dec. 19, 2023
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Sarbajit K. Rakshit, Kolkata, IN;

Sathya Santhar, Ramapuram, IN;

Sridevi Kannan, Chennai, IN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 11/00 (2006.01); G06N 3/0475 (2023.01); G06V 10/82 (2022.01); G06V 20/20 (2022.01); G06V 20/52 (2022.01);
U.S. Cl.
CPC ...
G06T 11/00 (2013.01); G06N 3/0475 (2023.01); G06V 10/82 (2022.01); G06V 20/20 (2022.01); G06V 20/52 (2022.01);
Abstract

Provided is a method, system, and computer program product for using a generative adversarial network to visually generate object deformation predictions. A processor may identify, based on an analysis of image data, a plurality of objects that are in a first stack formation. The processor may determine a load distribution of each object of the plurality of objects in relation to a subset of objects of the plurality of objects in the first stack formation. The processor may generate, using a generative adversarial network (GAN) algorithm and based on the load distribution for each object, a visualization depicting deformation of each object of the plurality of object in relation to the subset of objects of the plurality of objects in the first stack formation. The processor may display the visualization depicting the deformation of each object of the plurality of objects to a user.


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