The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2025

Filed:

Apr. 13, 2022
Applicant:

Aptiv Technologies Ag, Schaffhausen, CH;

Inventors:

Kamil Lelowicz, Bogunice, PL;

Mariusz Nowak, Katowice, PL;

Assignee:

Aptiv Technologies AG, Schaffhausen, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/80 (2017.01); G06T 7/13 (2017.01);
U.S. Cl.
CPC ...
G06T 7/80 (2017.01); G06T 7/13 (2017.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract

The present disclosure describes systems and techniques of using an algorithm to identify saddle points in camera calibration patterns. In implementations, the algorithm is a machine-learning model. In aspects, a computer-implemented method for determining pre-determined points in an input image includes applying a plurality of shifts to an input image to obtain a plurality of shifted images, detecting pre-determined points in each of the shifted images, re-shifting the detected pre-determined points, and determining the pre-determined points based on the re-shifted detected pre-determined points.


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Lelowicz, Kamil. (2025). Methods and systems for determining pre-determined points in an input image (U.S. Patent No. 12430800). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12430800

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