The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2025
Filed:
Oct. 29, 2021
Boe Technology Group Co., Ltd., Beijing, CN;
Sifan Wang, Beijing, CN;
Yulan Hu, Beijing, CN;
Yanzhao Li, Beijing, CN;
Chao Zhou, Beijing, CN;
Tuo Sun, Beijing, CN;
Longfei Li, Beijing, CN;
Shuo Zhang, Beijing, CN;
Zhenzhong Zhang, Beijing, CN;
Cuifang Zhang, Beijing, CN;
BOE Technology Group Co., Ltd., Beijing, CN;
Abstract
A linewidth measurement method includes: obtaining a target image of the line, the line including a first line segment; performing region connecting on an edge image or binary image of the target image to obtain a region connected image, the region connected image including a target connected region corresponding to a pattern of the line, and a pixel value of each pixel in the target connected region being different from that of each pixel outside the target connected region; determining a first edge point and a second edge point of the first line segment based on the region connected image; and determining a width of the first line segment according to the first edge point and the second edge point, and determining the width of the line according to the width of the first line segment.