The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2025

Filed:

Mar. 23, 2021
Applicant:

Genentech, Inc., South San Francisco, CA (US);

Inventors:

Jasmine Patil, South San Francisco, CA (US);

Neha Sutheekshna Anegondi, South San Francisco, CA (US);

Alexandre J Fernandez Coimbra, South San Francisco, CA (US);

Simon Shang Gao, South San Francisco, CA (US);

Michael Gregg Kawczynski, South San Francisco, CA (US);

Assignee:

Genentech, Inc., South San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/11 (2017.01); G06T 7/60 (2017.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06T 7/11 (2017.01); G06T 7/60 (2013.01); G06V 10/82 (2022.01); G06T 2207/10064 (2013.01); G06T 2207/10101 (2013.01); G06T 2207/30096 (2013.01);
Abstract

A method, system, and computer program product for evaluating a geographic atrophy lesion. An image of a geographic atrophy (GA) lesion is received. A first set of values is determined for a set of shape features using the image. A second set of values is determined for a set of textural features using the image. GA progression for the GA lesion is predicted using the first set of values and the second set of values.


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