The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2025
Filed:
Mar. 10, 2021
Omron Corporation, Kyoto, JP;
Yasuyuki Ikeda, Kyoto, JP;
OMRON Corporation, Kyoto, JP;
Abstract
An image inspection device includes: a divided image generation part for inputting a divided inspection image obtained by dividing an image of an inspection object and a surrounding-containing image that includes an image based on at least some of the surrounding images of the divided inspection image to a prelearned model having been trained so as to accept as inputs a divided good-article image obtained by dividing an image of a good-article inspection object and an image including an image based on at least some of the surrounding images of the divided good-article image and output a restored divided image; and an inspection part for performing inspection of the inspection object on the basis of the restored divided image generated by the divided image generation part.