The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2025
Filed:
Jan. 26, 2023
Nano Dimension Technologies Ltd, Ness Ziona, IL;
Eri Rubin, Kibbutz Ma'ale Ha'hamisha, IL;
Yotam Raz, Tel Aviv, IL;
Itay Mosafi, Tel Aviv, IL;
Marina Izmailov, Rehovot, IL;
Katia Huri, Givatayim, IL;
Eli David, Tel Aviv, IL;
NANO DIMENSION TECHNOLOGIES, LTD., Ness Ziona, IL;
Abstract
Methods of inspecting a product made by additive manufacturing (AM) of multiple layers, computer program products and inspection modules for AM systems are provided. An augmented file is derived from a design file including layer data used to produce the product by AM. For each design layer, the augmented file includes the layer data for the design layer and weighted layer data for design layers beneath the design layer. A machine learning (ML) algorithm (trained on previous images and augmented files) is applied with respect to the derived augmented file onto received optical inspection images of the product during the AM process to detect production errors.