The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2025
Filed:
Mar. 08, 2021
Omron Corporation, Kyoto, JP;
Yasuyuki Ikeda, Kyoto, JP;
OMRON CORPORATION, Kyoto, JP;
Abstract
An inspection system includes: a light emitting device configured to illuminate a target object; a collimator lens arranged between the light emitting device and the target object; and an imaging device configured to image the target object. The light emitting device is capable of changing a light emission position. The inspection system further includes an image analysis unit configured to generate an analysis image in which a value of each pixel corresponds to a normal direction of a surface of the target object appearing in the pixel, by analyzing a plurality of captured images obtained individually from a plurality of times of imaging where the light emission positions are different from each other. As a result, time and effort in adjustment for inspection can be reduced, and defect detection accuracy is improved.