The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2025
Filed:
Feb. 07, 2025
Kubota Corporation, Osaka, JP;
Srikanth Kadiyala, Fremont, CA (US);
Masaya Mori, Fremont, CA (US);
Kenta Nakamura, Fremont, CA (US);
Kotaro Shimada, Fremont, CA (US);
KUBOTA CORPORATION, Osaka, JP;
Abstract
A quality measurement system includes a first camera, a second camera, a display device, and a controller. The controller is configured or programmed to control the first camera to acquire a first image that includes agricultural items and to determine, from the first image, one of the agricultural items that is suitable for measuring quality. The controller is configured or programmed to control the second camera to acquire measurement data of the one of the agricultural items. The controller is configured or programmed to store estimation models for calculating at least one quality score based upon the measurement data acquired by the second camera and to select one of the estimation models according to the one of the agricultural items. The controller is configured or programmed to calculate the at least one quality score of the one of the agricultural items based upon the selected one of the estimation models.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile