The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2025
Filed:
Jul. 15, 2021
Verizon Patent and Licensing Inc., Basking Ridge, NJ (US);
Andrew Feng, Cupertino, CA (US);
Jun Shi, Sunnyvale, CA (US);
Mridul Jain, Cupertino, CA (US);
Peter Cnudde, Los Altos, CA (US);
Verizon Patent and Licensing Inc., Basking Ridge, NJ (US);
Abstract
The present teaching relates to distributed deep machine learning on a cluster. In one example, a request is received for estimating one or more parameters associated with a machine learning model on a cluster including a plurality of nodes. A set of data is obtained to be used for estimating the one or more parameters. The set of data is divided into a plurality of sub-sets of data, each of which corresponds to one of the plurality of nodes. Each sub-set of data is allocated to a corresponding node for estimating values of the one or more parameters based on the sub-set of data. Estimated values of the one or more parameters obtained based on a corresponding sub-set of data allocated to the node, are received from each of the plurality of nodes. The one or more parameters of the machine learning model are estimated based on the estimated values of the one or more parameters generated by at least some of the plurality of nodes.