The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2025

Filed:

Aug. 16, 2023
Applicant:

Tata Consultancy Services Limited, Mumbai, IN;

Inventors:

Subhasish Ghosh, Kolkata, IN;

Arpita Kundu, Kolkata, IN;

Indrajit Bhattacharya, Kolkata, IN;

Pratik Saini, Noida, IN;

Tapas Nayak, Kolkata, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 40/14 (2020.01); G06F 40/137 (2020.01); G06F 40/205 (2020.01); G06F 40/40 (2020.01); G06Q 50/20 (2012.01); G06V 30/413 (2022.01);
U.S. Cl.
CPC ...
G06F 40/40 (2020.01); G06F 40/137 (2020.01); G06F 40/205 (2020.01); G06Q 50/20 (2013.01); G06V 30/413 (2022.01); G06V 2201/10 (2022.01);
Abstract

The present disclosure a method for document structure based unsupervised long-form technical question generation. Initially, the system receives a textbook document. Further, a PDF metadata is extracted from the textbook document using a Natural Language Processing (NLP) technique. Further, a plurality of structures from the textbook document based on the PDF metadata using an NLP based filtering technique. Further, a plurality of index based question templates and Table of Contents (TOC) based question templates are obtained from a plurality of predefined question templates using the plurality of structures. Further, the generated plurality of long-form technical questions are generated using the obtained index and TOC based question templates. The plurality of long-form technical questions are further evaluated by the system using plurality of metrics. Further, the generated plurality of long-form technical questions are used to finetune a supervised question generation model for generating optimal questions from document structure.


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