The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2025

Filed:

Mar. 28, 2024
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Jonas Weiss, Oberrieden, CH;

Robert Dean Lovchik, Schoenenberg, CH;

Alessandro Sorniotti, Zurich, CH;

Julia Hesse, Langnau am Albis, CH;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/00 (2013.01); G06F 21/32 (2013.01); G06F 21/36 (2013.01); H04L 9/32 (2006.01); G06Q 20/40 (2012.01);
U.S. Cl.
CPC ...
G06F 21/36 (2013.01); G06F 21/32 (2013.01); H04L 9/3297 (2013.01); G06Q 20/40145 (2013.01);
Abstract

Mechanisms for verifying a captured digital image are provided. A verifier computing system generates, in response to a request to perform digital identity verification of a subject, a computer readable first encoded pattern. Light projecting equipment of the verifier computing system, projects the first encoded pattern onto a physical surface associated with the subject. Digital image capturing equipment of a prover computing system captures a digital image of the subject while the first encoded pattern is projected onto the physical surface such that the captured digital image captures both an image of the subject and the projected first encoded pattern. The prover computing system generates a second pattern based on an extraction key received from the verifier computing system. The prover computing system verifies an authenticity of the captured digital image based on a matching of the second pattern to the first pattern.


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