The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2025
Filed:
Nov. 16, 2022
Method and apparatus for processing synthetic features, model training method, and electronic device
Beijing Baidu Netcom Science Technology Co., Ltd., Beijing, CN;
Kafeng Wang, Beijing, CN;
Chengzhong Xu, Beijing, CN;
Haoyi Xiong, Beijing, CN;
Xingjian Li, Beijing, CN;
Dejing Dou, Beijing, CN;
BEIJING BAIDU NETCOM SCIENCE TECHNOLOGY CO., LTD., Beijing, CN;
Abstract
A method for processing synthetic features is provided, and includes: the synthetic features to be evaluated and original features corresponding to the synthetic features are obtained. A feature extraction is performed on the synthetic features to be evaluated based on a number S of pre-trained samples, to obtain meta features with S samples. S is a positive integer. The meta features are input into the pre-trained meta feature evaluation model for a binary classification prediction, to obtain a probability of binary classification. Quality screening is performed on the synthetic features to be evaluated according to the probability of the binary classification, to obtain second synthetic features to be evaluated. The second synthetic features are classified in a good category. The second synthetic features and original features are input into a first classifier for evaluation. classified in a poor category.