The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2025
Filed:
Jan. 31, 2024
Applicant:
Splunk Inc., San Francisco, CA (US);
Inventors:
Nir Frenkel, Santa Clara, CA (US);
Marcus Vinicius Rodrigues Galdino, San Francisco, CA (US);
Vinay Manivel, San Jose, CA (US);
Balaji Rao, San Jose, CA (US);
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 16/2453 (2019.01); G06F 16/248 (2019.01); G06F 16/25 (2019.01);
U.S. Cl.
CPC ...
G06F 16/24535 (2019.01); G06F 16/24542 (2019.01); G06F 16/248 (2019.01); G06F 16/256 (2019.01);
Abstract
A data intake and query system can process a query to identify subquery tokens corresponding to subqueries to be executed by external data systems. The data intake and query system can process the subquery tokens to generate modified subqueries to be executed by the external data systems. The modified subqueries can cause the external data system to return metadata associated with the events processed by the external data systems during executing of the modified subqueries.