The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2025

Filed:

Oct. 04, 2022
Applicant:

At&t Intellectual Property I, L.p., Atlanta, GA (US);

Inventors:

Edmond J. Abrahamian, Richmond Heights, MO (US);

Ana Armenta, San Jose, CA (US);

Andrew Campbell, Pleasant Hill, CA (US);

Jean Luo, Millbrae, CA (US);

Elijah Hall, Plano, TX (US);

Prince Paulraj, Coppell, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/30 (2019.01); G06F 16/23 (2019.01);
U.S. Cl.
CPC ...
G06F 16/23 (2019.01);
Abstract

A processing system may obtain a request to add at least a first feature to a feature graph database, where the request comprises a first feature ontology of the first feature, and where the first feature ontology comprises: a label of the first feature and a relationship of the first feature to a concept or to another feature. The processing system may then identify whether the first feature is a duplicate of a second feature in the feature graph database based at least upon the first feature ontology and a second feature ontology of the second feature and generate an indication of whether the first feature is a duplicate in response to the identifying.


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