The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2025

Filed:

Apr. 25, 2023
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Chi Chen, Chengdu, CN;

Nan Wang, Chengdu, CN;

Jing Ye, Chengdu, CN;

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/3668 (2025.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01); G06F 11/3688 (2013.01);
Abstract

Techniques for generating a test case involve: acquiring a first set of coding sequences representing a first set of test cases selected from a test case set for product testing. A test element in a test case of the test case set is coded based on the position of the test element in the element hierarchy of the test case set. The techniques further involve: generating a second set of coding sequences by performing a random variation related to at least one test element with respect to the first set of coding sequences; and generating a second set of test cases based on the second set of coding sequences. Accordingly, product testing and development may be automated, and the case set may change dynamically in a way that is adapted to product development while significantly reducing the overhead of designing and reviewing test cases throughout the product life cycle.


Find Patent Forward Citations

Loading…