The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2025
Filed:
May. 22, 2023
Dell Products L.p., Round Rock, TX (US);
Chaojun Zhao, Chengdu, CN;
Weilan Pu, Chengdu, CN;
Shuangshuang Liang, Zunyi, CN;
Yang Zhang, Chengdu, CN;
Jingyi Wang, Chengdu, CN;
Dell Products L.P., Round Rock, TX (US);
Abstract
Methods, system, and non-transitory processor-readable storage medium for a test selection system are provided herein. An example method includes selecting, by a test selection system, a regression test case from a plurality of regression test cases in a software testing lifecycle system. The test selection system determines a product release weight associated with the regression test case, where the product release weight incorporates new features associated with a product release. The test selection system obtains a regression test case value for the regression test case by applying the product release weight. The test selection system selects the regression test case for use in regression testing for the product release, based on the regression test case value and executes the regression test case on a system.