The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2025
Filed:
Jul. 28, 2023
International Business Machines Corporation, Armonk, NY (US);
Nitin Tewari, Ghaziabad, IN;
Mayank Sharma, Bangalore, IN;
Vinay Nair, Hyderabad, IN;
Aditi Bhattacharya, Kolkata, IN;
Sandeep Dixit, Bangalore, IN;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A computer-implemented method, according to one embodiment, includes analyzing application details associated with a plurality of different timestamp intervals, in response to a determination, from results of analyzing runtime information associated with an application failure event and/or sub-par runtime performance that occurs during a first operational run cycle of an application, that the failure event and/or sub-par runtime performance is caused by a Non-Functional Requirement (NFR) issue. In response to a determination that a first of the timestamp intervals falls within a timestamp associated with the application failure event and/or sub-par runtime performance, first pattern information about the application details associated with the first timestamp interval is collected. The method further includes applying the first pattern information to a weightage algorithm. In response to a determination that test coverage gaps exist in a predetermined collection of test cases, test cases are created based on the first pattern information.