The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2025

Filed:

Jan. 13, 2022
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Yuxin Qin, Shanghai, CN;

Xiaoyu Zhang, Shanghai, CN;

Chenjie Zhou, Shanghai, CN;

Xiang Chen, Shanghai, CN;

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/50 (2006.01);
U.S. Cl.
CPC ...
G06F 9/5077 (2013.01); G06F 2209/5011 (2013.01); G06F 2209/505 (2013.01);
Abstract

A disclosed method for developing and testing a hyper-converged infrastructure (HCI) platform creates a snapshot pool with one or more virtual resource snapshots that include one or more virtual node snapshots, one or more virtual cluster snapshots, or both. The snapshot pool may be maintained with a desired quantity of the virtual resource snapshots by adjusting the composition of the snapshot pool in response to snapshot events, including an event that alters either a composition of the snapshot pool or a configuration of the HCI platform. The desired quantity of virtual resource snapshots may be determined in accordance with one or more snapshot thresholds. The snapshot thresholds may include a snapshot pertaining to a quantity of virtual node snapshots in the snapshot pool and/or a snapshot pertaining to a quantity of virtual cluster snapshots. Specifically, the threshold may include a cluster maximum and minimum and a node maximum and minimum.


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