The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2025

Filed:

Mar. 27, 2024
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Michael Klein, Schoenaich, DE;

Kerstin Claudia Schelm, Stuttgart, DE;

Petra Leber, Ehningen, DE;

Andreas Wagner, Wildberg, DE;

Bruce Conrad Giamei, Lagrangeville, NY (US);

Timothy Slegel, Staatsburg, NY (US);

Jonathan D. Bradbury, Poughkeepsie, NY (US);

Reid Copeland, Ontario, CA;

Xin Guo, Toronto, CA;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/30 (2018.01);
U.S. Cl.
CPC ...
G06F 9/30007 (2013.01); G06F 9/30003 (2013.01); G06F 9/30036 (2013.01); G06F 9/30076 (2013.01); G06F 9/30094 (2013.01);
Abstract

An instruction to perform validity testing of a source value is executed. The executing the instruction includes obtaining the source value using at least one field of the instruction and obtaining a plurality of test controls using a field of the instruction. The one or more test controls of the plurality of test controls are used to specify which digit positions of the source value are to be tested for validity and what codes are valid codes for the digit positions specified to be tested. Validity testing of at least a portion of the source value is performed based on the plurality of test controls obtained using the field of the instruction, and the performing the validity testing provides a result. The result is provided for use in further processing.


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