The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2025

Filed:

Oct. 27, 2022
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Girish Sheelvant, Hopkinton, MA (US);

Dmitry Nikolayevich Tylik, Westborough, MA (US);

Patricia B. Campbell, Franklin, MA (US);

Carole Gelotti, Nashua, NH (US);

Binbin Liu Lin, Sudbury, MA (US);

Lalitha Natarajan, Hopkinton, MA (US);

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0655 (2013.01); G06F 3/0604 (2013.01); G06F 3/067 (2013.01);
Abstract

A technique is disclosed for ending metro-clustering on metro volumes. The technique includes collecting a plurality of metrics that indicate respective characteristics associated with a metro volume. In response to receiving a request to end metro on the metro volume, the technique includes comparing the plurality of metrics with a database that associates multiple permutations of metrics with respective procedures for ending metro. The technique further includes identifying, based on the comparison, a target procedure having a permutation of metrics that matches the plurality of metrics and implementing the target procedure.


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