The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2025
Filed:
Aug. 17, 2020
Gkn Sinter Metals Engineering Gmbh, Radevormwald, DE;
Thomas Villgrattner, Brixen, IT;
Gottfried Rier, Bruneck Dietenheim, IT;
Meinhard Ploner, Bruneck, IT;
Christina Messner, Bruneck St. Georgen, IT;
GKN Sinter Metals Engineering GmbH, Radevormwald, DE;
Abstract
A method for controlling a production process for components, wherein the components or a production device used for producing the components have or has features which are metrologically detectable. The method comprising specifying a test plan for detecting primary feature(s) and secondary feature(s) by tests, wherein the primary feature(s) is/are measured at a first test frequency and the secondary feature(s) is/are measured at a second test frequency, wherein at least one stability criterion is defined for the primary feature(s); producing the components and carrying out the test plan for producing test results in parallel, wherein solely the primary feature(s) is/are tested at the first test frequency; evaluating the determined test results; and, if at least one test result for the primary feature(s) violates the stability criterion, continuing the carrying out of the test plan, wherein at least a secondary feature is tested.