The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2025
Filed:
Apr. 26, 2023
Okuma Corporation, Niwa-Gun, JP;
Takumi Hongo, Niwa-Gun, JP;
Okuma Corporation, Niwa-Gun, JP;
Abstract
A feed axis monitoring device includes a position deviation calculating unit, a machined surface perpendicular direction calculating unit, a position deviation component converting unit, a threshold value calculating unit, and an abnormality determining unit. The position deviation calculating unit calculates a position deviation of the feed axis. The machined surface perpendicular direction calculating unit calculates a direction perpendicular to a machined surface at a time of a position deviation calculation. The position deviation component converting unit converts a position deviation of the feed axis into a component in the perpendicular direction. The threshold value calculating unit calculates a threshold value based on a preset relation between an operating state of the main spindle and the threshold value. The abnormality determining unit determines that the feed axis has an abnormality when the position deviation exceeds the threshold value.