The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2025

Filed:

Dec. 25, 2020
Applicants:

Hidetoshi Kami, Shizuoka, JP;

Tomoharu Asano, Kanagawa, JP;

Ryota Inoue, Shizuoka, JP;

Inventors:

Hidetoshi Kami, Shizuoka, JP;

Tomoharu Asano, Kanagawa, JP;

Ryota Inoue, Shizuoka, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03G 5/147 (2006.01);
U.S. Cl.
CPC ...
G03G 5/14704 (2013.01); G03G 5/14773 (2013.01); G03G 5/14795 (2013.01);
Abstract

An electronic device includes a support, a charge-transporting layer, a silicone-containing layer, and a metal oxide film. The charge-transporting layer includes a charge-transporting material or a dye-sensitizing electrode layer including a sensitizing dye. The charge-transporting layer or the sensitizing-dye electrode layer is disposed on or above the support. The silicone-containing layer is disposed on or above the charge-transporting layer or the sensitizing-dye electrode layer. The metal oxide film is disposed on or above the silicone-containing layer. A ratio [Q(ACL)/Q(CTL)] is 10% or greater, where Q(ACL) is a time integral of a transient photocurrent waveform of an electronic device (ACL) measured by a time-of-flight method, and Q(CTL) is a time integral of a transient photocurrent waveform of an electronic device (CTL) measured by a time-of-flight method.


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