The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2025

Filed:

Oct. 06, 2020
Applicant:

Essilor International, Charenton-le-Pont, FR;

Inventors:

Matthieu Guillot, Charenton-le-Pont, FR;

Cédric Lemaire, Charenton-le-Pont, FR;

Eric Gacoin, Charenton-le-Pont, FR;

Marion Cornet, Charenton-le-Pont, FR;

Assignee:

Essilor International, Charenton-le-Pont, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02C 7/02 (2006.01); G01M 11/02 (2006.01); G02B 27/00 (2006.01);
U.S. Cl.
CPC ...
G02C 7/027 (2013.01); G01M 11/0228 (2013.01); G02B 27/0012 (2013.01); G02C 7/028 (2013.01); G02C 2202/24 (2013.01);
Abstract

A method for characterizing optical elements of a lens element adapted for a person is presented, the lens element including: a holder including a refraction area having a refractive power based on a prescription for correcting an abnormal refraction of an eye of the person; and a plurality of optical elements configured so that at least one of slow down, retard or prevent a progress of the abnormal refraction of the eye of the person. A two-dimensional representation of the local optical power of the lens element is obtained using a fringe deflectometry method and the images used for the fringe deflectometry method consist of pixels smaller than or equal to 0.05 mm×0.05 mm.


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