The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2025
Filed:
Aug. 24, 2023
Electronics and Telecommunications Research Institute, Daejeon, KR;
Munseob Lee, Daejeon, KR;
Chihoon Kim, Daejeon, KR;
Sang Yun Kim, Daejeon, KR;
Ji Won Park, Daejeon, KR;
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE, Daejeon, KR;
Abstract
Provided are a plenoptic microscope system having a structure in which a microlens array (MLA) is installed between an object and a microscope optical system and a general microscope camera is used as an image sensor, and an image processing apparatus for performing plenoptic imaging with information acquired from the same. In the plenoptic microscope system, an MLA including at least one microlens having a number of apertures (NA) similar to that of an objective lens of a microscope optical system is positioned at the front end of an incidence part of the microscope optical system and the objective lens is positioned at a focal length of the MLA or on an image plane of the MLA. The plenoptic image processing apparatus generates Plenoptic 1.0 and/or 2.0 images.