The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2025

Filed:

May. 02, 2023
Applicant:

Exfo Inc., Quebec, CA;

Inventors:

Olivier Cote, Quebec, CA;

Mario L'heureux, Quebec, CA;

Raphael Laberge, Quebec, CA;

Assignee:

EXFO Inc., Quebec, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 6/38 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G02B 6/385 (2013.01); G02B 6/3825 (2013.01); G02B 6/3853 (2013.01); G02B 21/0016 (2013.01); G02B 21/0008 (2013.01);
Abstract

There is provided an adapter tip to be employed with an optical-fiber connector-endface inspection microscope device and an optical-fiber connector endface inspection microscope system suitable for imaging the endface of a duplex optical-fiber connector. Because of the distance between the ferrules of a duplex connector, the field of view of a typical single-fiber or multi-fiber inspection microscope may not be wide enough to allow inspection of both ferrules at once. The proposed adapter tip or microscope system may comprise relay optics configured to laterally shift the optical path of the light beam reflected from one optical fiber endface (corresponding the first ferrule) toward that from the other optical fiber endface (corresponding the second ferrule), so that both endfaces may be imaged within the field of view of the inspection microscope.


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