The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2025
Filed:
Sep. 13, 2022
Topcon Corporation, Tokyo, JP;
Takeshi Kikuchi, Tokyo, JP;
TOPCON CORPORATION, Tokyo, JP;
Abstract
A hammering test system includes a hammering test device including a target, a flying unit, and a hammering test mechanism configured to conduct a hammering test on a test object, a surveying instrument including a scanner for acquiring point cloud data by scanning with scanning light, and configured to be capable of performing tracking and distance and angle measurements of the target, and an arithmetic processing unit including a point cloud data analyzing unit configured to calculate shape data by analyzing point cloud data acquired by the scanner, and a flight plan calculating unit configured to calculate a flight plan of the hammering test device based on the shape data calculated by the point cloud data analyzing unit, and the surveying instrument tracks the target of the hammering test device and makes distance and angle measurements when the hammering test mechanism conducts a hammering test.