The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2025
Filed:
May. 16, 2022
Aeva, Inc., Mountain View, CA (US);
Jose Krause Perin, Mountain View, CA (US);
Esha John, Sunnyvale, CA (US);
Kumar Bhargav Viswanatha, Santa Clara, CA (US);
Mina Rezk, Haymarket, VA (US);
Rajendra Tushar Moorti, Mountain View, CA (US);
Aeva, Inc., Mountain View, CA (US);
Abstract
A light detection and ranging (LIDAR) system performs a method including generating a frequency domain waveform based on a baseband signal in a time domain, determining a first likelihood metric for frequencies in the frequency domain waveform, and identifying one or more frequencies in the frequency domain waveform that exceed a threshold value for the first likelihood metric. The method further includes determining a second likelihood metric for the frequencies in the frequency domain waveform, selecting a peak frequency from the frequency domain waveform corresponding to the frequency with the highest value for the second likelihood metric based on the one or more frequencies in the frequency domain waveform that exceed the threshold value for the first likelihood metric, and determining one or more properties of a target based at least in part on the selected peak frequency and the corresponding values of the first and second likelihood metrics.