The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2025

Filed:

Sep. 14, 2020
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Yuwei Ren, Beijing, CN;

Weimin Duan, San Diego, CA (US);

Huilin Xu, Temecula, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 5/02 (2010.01); G01S 5/14 (2006.01); H04W 24/10 (2009.01);
U.S. Cl.
CPC ...
G01S 5/0215 (2013.01); G01S 5/0284 (2013.01); G01S 5/14 (2013.01); H04W 24/10 (2013.01);
Abstract

In a wireless communication system, cross-link interference (CLI) measurements are used for received signal strength indicator (RSSI) based positioning. A first user equipment (UE) receives from a base station, a first message comprising a cross-link interference (CLI) configuration; performs one or more CLI measurements associated with an uplink transmission of a second UE based on the CLI configuration; receives a second message comprising an uplink transmission power measurement of the second UE; determines a pathloss associated with the second UE based on the one or more CLI measurements and the uplink transmission power measurement; and determines a range between a location of the first UE and a location of the second UE based on the pathloss.


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