The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2025

Filed:

Mar. 28, 2023
Applicant:

Siemens Healthineers Ag, Forchheim, DE;

Inventor:

Michael Köhler, Nuremberg, DE;

Assignee:

Siemens Healthineers AG, Forchheim, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/385 (2006.01);
U.S. Cl.
CPC ...
G01R 33/385 (2013.01);
Abstract

In a method for measuring a gradient field in a magnetic resonance tomography (MRT) system, a first slice is excited by a first radio frequency (RF) pulse being emitted and by a first slice selection gradient being switched at least partly at the same time as the first RF pulse. A second slice is excited by a second RF pulse being emitted and by a second slice selection gradient being switched at least partly at the same time as the second RF pulse. The second slice intersects with the first slice in an intersection region. After the excitation of the second slice, a readout gradient is switched, and an MR signal emitted from the intersection region is acquired. Depending on the MR signal, a disruption variable is computed, which determines a deviation of a temporal course of an amplitude of the readout gradient from a predetermined required course.


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