The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2025
Filed:
Jan. 30, 2024
Em Labs, Inc., Hyogo, JP;
Yoshiyuki Yanagimoto, Hyogo, JP;
Atsushi Hattori, Hyogo, JP;
EM labs, Inc., Hyogo, JP;
Abstract
In a dielectric characteristic measurement method, a step of mounting a sample of which dielectric characteristic is measured on an open resonator and adjusting a position of the sample includes: a first measurement step for performing a first resonance measurement by sweeping a predetermined sweep frequency range at a first number of measurement points; and a second and subsequent measurement steps for performing a plurality times of resonance measurement following the first resonance measurement, wherein each of the plurality times of resonance measurement is performed by sweeping a sweep frequency range specified based on an immediately preceding resonance measurement at a second number of the measurement points which is less than the first number of the measurement points, and the sweep frequency range of a second resonance measurement in the plurality times of resonance measurement is specified based on the first resonance measurement.