The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2025
Filed:
Jun. 23, 2021
Mitsubishi Electric Corporation, Tokyo, JP;
Masafumi Takeda, Tokyo, JP;
Tetsuhiro Fukao, Tokyo, JP;
Mitsubishi Electric Corporation, Tokyo, JP;
Abstract
Provided here are: a measuring probe that is to be connected to a terminal pad of a measurement object; a measuring probe that is to be connected to a terminal pad of the measurement object, said terminal pad being electrically conductive with the terminal pad of the measurement object; and a signal source that is connected to both the measuring probe and the measuring probe and that can write or read a signal in or from the measurement object through each of the measuring probe and the measuring probe. Accordingly, it is possible to apply a signal from the signal source to the measurement object even if foreign substances are deposited on one of the measuring probes, without widely setting the measurement area for the measurement object. This reduces the problem of defective contact.