The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2025

Filed:

Oct. 19, 2022
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventor:

Masuto Kitamura, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/24 (2006.01); G01N 29/04 (2006.01); G01N 29/34 (2006.01); H04N 23/63 (2023.01);
U.S. Cl.
CPC ...
G01N 29/2418 (2013.01); G01N 29/045 (2013.01); G01N 29/348 (2013.01); G01N 2291/023 (2013.01); G01N 2291/0289 (2013.01); H04N 23/63 (2023.01);
Abstract

An exciter () induces an elastic wave in a test object by sequentially giving the object multiple kinds of vibrations having different frequencies. An illuminator () performs stroboscopic illumination on a measurement area on the surface of the object. A displacement measurer () controls the timing of the stroboscopic illumination with respect to the phase of the elastic wave for each kind of vibration to perform a batch measurement of the displacements, in the off-plane direction of the surface, of the points within the measurement area at least at three different phases of the elastic wave, using speckle interferometry or speckle-shearing interferometry.


Find Patent Forward Citations

Kitamura, Masuto. (2025). Defect detection device and defect detection method (U.S. Patent No. 12429461). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12429461

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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