The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2025
Filed:
Mar. 31, 2022
Applicant:
Meta Platforms Technologies, Llc, Menlo Park, CA (US);
Inventors:
Alireza Moheghi, Bothell, WA (US);
Kang Wei, Redmond, WA (US);
William Duncan, Kenmore, WA (US);
Peter Jasinski, Redmond, WA (US);
Assignee:
Meta Platforms Technologies, LLC, Menlo Park, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 11/02 (2006.01); G01M 11/04 (2006.01);
U.S. Cl.
CPC ...
G01M 11/0207 (2013.01); G01M 11/04 (2013.01);
Abstract
An apparatus, system, and method for a see-through optical verification tester are described herein. In some aspects, a heating element such as a Peltier or Thermoelectric Cooler 'TEC' may be used to control a temperature of an optical element. In examples, the see-through optical transmission tester includes a see-through void and may control temperature, humidity, and pressure of an environmental enclosure to facilitate optical see-through and reflective tests.