The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12429374 B1

Date of Patent:

Sep. 30, 2025

Filed:

Dec. 11, 2023

Characteristic value correction device, characteristic value calculation device, inspection device including the same, characteristic value correction method, light-emitting device, and characteristic value correction program

Applicant:

Nichia Corporation, Anan, JP;

Inventor:

Yoshiki Yamaji, Anan, JP;

Assignee:

NICHIA CORPORATION, Anan, JP;

Attorney:

Global IP Counselors, LLP

Primary Examiner:

Henry Luong

Int. Cl.

CPC ...

H05B 45/14 (2020.01); G01J 1/20 (2006.01); G01J 1/42 (2006.01);

U.S. Cl.

CPC ...

G01J 1/4257 (2013.01); G01J 1/20 (2013.01); H05B 45/14 (2020.01);

Abstract

A characteristic value correction device includes a waveform acquiring unit, an area calculating unit, a time calculating unit, and a correction coefficient calculating unit. The waveform acquiring unit is configured to acquire a waveform indicating a relationship between an elapsed time and a first current value obtained when the pulse current is applied to a light-emitting device. The area calculating unit is configured to calculate a first area of an entire waveform and a second area of a rectangular wave portion. The time calculating unit is configured to calculate a first time between an application start time and an application end time of the pulse current and a second time corresponding to the second area. The correction coefficient calculating unit is configured to obtain a correction coefficient based on a ratio between the first area and the second area and a ratio between the first time and the second time.

Find Patent Forward Citations

Yamaji, Yoshiki. (2025). Characteristic value correction device, characteristic value calculation device, inspection device including the same, characteristic value correction method, light-emitting device, and characteristic value correction program (U.S. Patent No. 12429374). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12429374

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