The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2025

Filed:

Jan. 08, 2022
Applicant:

Honeywell International Inc., Charlotte, NC (US);

Inventors:

Bin Sai, The Hague, NL;

Marc M. Pos, Duvall, WA (US);

Charan Ebsv, Telangana, IN;

Assignee:

Honeywell International Inc., Charlotte, NC (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F 23/284 (2006.01); G01S 13/42 (2006.01); H03L 7/099 (2006.01);
U.S. Cl.
CPC ...
G01F 23/284 (2013.01); G01S 13/426 (2013.01); H03L 7/099 (2013.01);
Abstract

In an embodiment, a radar level gauge system can include an antenna system comprising an imaging phased array in an isolated antenna arrangement that supports monopulse processing for radar image resolution and mapping of a surface of a material. The imaging phased array can provide a narrow-beam with beam scanning/steering and can emit a transmit beam that scans the surface of the material and forms the mapping of the surface. The mapping can comprise a 3D volumetric model that can include an image of a surface profile of the surface based on signals returned from the surface. The imaging phase array and the antenna system are protected from condensation and contamination from chemicals and viscous materials.


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