The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2025
Filed:
Apr. 21, 2022
Institut National DE LA Recherche Scientifique, Quebec, CA;
Bennet Fischer, Montreal, CA;
Mario Chemnitz, Montreal, CA;
Benjamin Maclellan, Stirling, CA;
Piotr Roztocki, Longueuil, CA;
José Azaña, Montreal, CA;
Yoann Jestin, Montreal, CA;
Roberto Morandotti, Montreal, CA;
INSTITUT NATIONAL DE LA RECHERCHE SCIENTIFIQUE, Québec, CA;
Abstract
A method and a system for arbitrary optical waveform generation from an optical input, the system comprising an optical shaper comprising unbalanced interferometers with at least one delay, the delay being selected of at least 0.1 ps, an optical sampling readout selected for measuring optical waveforms of at least 0.1 ps; and an electronic processing unit; wherein the optical input is a picosecond pulse; with a minimal pulse duration before the optical shaper equal to a minimal delay of the optical shaper; the optical shaper splitting and interfering optical pulses; the optical sampling readout collecting data at an output of the optical shaper; and the electronic processing unit comparing the collected data with a preset target and updating the optical shaper from results of the comparison until a maximal match between the output of the optical shaper and the preset target output, wherein the maximal match is determined iteratively using one of: machine-learning, optimization algorithms and iterative search algorithms.