The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2025

Filed:

Nov. 09, 2023
Applicant:

The General Hospital Corporation, Boston, MA (US);

Inventors:

Benjamin J. Vakoc, Arlington, MA (US);

Norman Lippok, Quincy, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2022.01); G01B 9/02001 (2022.01); G01B 9/02091 (2022.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G01B 9/0201 (2013.01); G01B 9/02008 (2013.01); G01B 9/02091 (2013.01); G06T 7/0012 (2013.01); G06T 2207/10101 (2013.01); G06T 2207/30004 (2013.01);
Abstract

A method including: scanning a sample over a period of time using an electro-magnetic radiation source, the period of time including a first time period and a second time period, a sample portion of the electro-magnetic radiation source being directed to the sample in a sample arm of an optical interferometric system, and a reference portion of the electro-magnetic radiation source being directed to a reference arm of the optical interferometric system; applying, using a phase modulator, a phase shift comprising a first phase shift and a second phase shift to at least one of the reference portion or the sample portion of the electro-magnetic radiation source, the first phase shift being applied during the first time period and the second phase shift being applied during the second time period, the second phase shift having a difference of 90 degrees from the first phase shift.


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