The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2025
Filed:
Jul. 06, 2023
Buerkert Werke Gmbh & Co. KG, Ingelfingen, DE;
Andreas Ungerer, Ingelfingen, DE;
BUERKERT WERKE Gmbh & CO. KG, Ingelfingen, DE;
Abstract
A method of monitoring a state of a component and/or a process value including detecting and comparing at least one value characteristic of the state to be monitored with a defined value, and/or a process value, wherein, for each deviation of the detected value from the defined value, a mean value of the deviation or of the detected characteristic value is calculated and/or a maximum value and/or a minimum value and/or a count value is determined and first stored in a first storage cell within a preset first time interval. The further storage cells are successively filled in the same way for one respective preset time interval until all storage cells present are filled with a corresponding value. When all storage cells are filled, a mean value is formed from the values of respectively at least two storage cells filled immediately one after the other and is stored in a single storage cell, the previously stored value being overwritten, and the storage cells in which the previously stored value has not been overwritten being used for storing the subsequently detected values.